The 78th JSAP Autumn Meeting, 2017

Presentation information

Oral presentation

13 Semiconductors » 13.8 Compound and power electron devices and process technology

[5p-C17-1~17] 13.8 Compound and power electron devices and process technology

Tue. Sep 5, 2017 1:45 PM - 6:15 PM C17 (Training Room 2)

Masashi Kato(NITech), Taketomo Sato(Hokkaido Univ.)

6:00 PM - 6:15 PM

[5p-C17-17] 5 kV breakdown voltage GaN p-n diodes fabricated on free-standing GaN substrates

Hiroshi Ohta1, Kentaro Hayashi1, Fumimasa Horikiri2, Yoshinobu Narita2, Takehiro Yoshida2, Tohru Nakamura1, 〇Tomoyoshi Mishima1 (1.Hosei Univ., 2.SCIOCS)

Keywords:semiconductor, GaN, diode

A high breakdown voltage of 5.0 kV has been achieved by applying our newly developed guard-ring structure to GaN p-n junction diodes fabricated on freestanding GaN substrates.