Analysis of current jump and memory effect observed in high temperature operation of MoS<sub>2</sub> single crystal FET

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Poster presentation

17 Nanocarbon Technology » 17 Nanocarbon Technology（Poster）

Tue. Sep 5, 2017 1:30 PM - 3:30 PM PA1 (P)

1:30 PM - 3:30 PM

〇Tomoki Yamanaka¹, Ayaka Higuchi¹, Masahiro Matsunaga¹, Kota Kamiya¹, Guanchen He², Jonathan Bird², Nobuyuki Aoki¹ (1.Chiba Univ., 2.SUNY Buffalo)

Keywords:MoS2