9:30 AM - 11:30 AM
△ [6a-PA9-7] Interface state generation in Al2O3/InGaAs MOS structures by electrical stress
Keywords:InGaAs, reliability, Interface state
Poster presentation
13 Semiconductors » 13.3 Insulator technology
Wed. Sep 6, 2017 9:30 AM - 11:30 AM PA9 (P)
9:30 AM - 11:30 AM
Keywords:InGaAs, reliability, Interface state