The 78th JSAP Autumn Meeting, 2017

Presentation information

Oral presentation

15 Crystal Engineering » 15.7 Crystal evaluation, impurities and crystal defects

[6p-A503-1~12] 15.7 Crystal evaluation, impurities and crystal defects

Wed. Sep 6, 2017 1:45 PM - 5:00 PM A503 (503)

Yutaka Ohno(Tohoku Univ.), Hiroaki Kariyazaki(GWJ), Satoko Nakagawa(GWJ)

1:45 PM - 2:00 PM

[6p-A503-1] Impact of electron dose for analysis on carbon concentration in silicon crystal using photoluminescence spectroscopy after electron irradiation via luminescence activation

Satoko Nakagawa1, Yuta Nagai1 (1.GWJ)

Keywords:photoluminescence, carbon, electron irradiation