1:45 PM - 2:00 PM
▲ [7p-C13-1] Welcome to the symposium on recent GFIS / advanced ion source microscopy
Keywords:helium ion microscope, gas field ion microscope
Presentation information
Symposium (Oral)
Symposium » Recent GFIS /advanced ion source microscopy technologies and its future prospects for R & D of materials and devices
[7p-C13-1~9] Recent GFIS /advanced ion source microscopy technologies and its future prospects for R & D of materials and devices
Thu. Sep 7, 2017 1:45 PM - 6:00 PM C13 (office 2-2)
Reo Kometani(Univ. of Tokyo), Hiroshi Mizuta(JAIST), Shinichi Ogawa(AIST)