2017年第78回応用物理学会秋季学術講演会

講演情報

シンポジウム(口頭講演)

シンポジウム » GFIS(電界電離ガスイオン源)・先端イオン源顕微鏡技術とその材料・デバイス研究開発への応用

[7p-C13-1~9] GFIS(電界電離ガスイオン源)・先端イオン源顕微鏡技術とその材料・デバイス研究開発への応用

2017年9月7日(木) 13:45 〜 18:00 C13 (事務室2-2)

米谷 玲皇(東大)、水田 博(北陸先端大)、小川 真一(産総研)

15:15 〜 15:45

[7p-C13-5] Nanopore Fabrication to Two Dimensional Crystals by Adjusting Dose and focus of Helium Ion Microscope

Kentaro Kawai1、Takumi Hayashi1、Kenta Arima1、Osamu Tabata2 (1.Osaka University、2.Kyoto Univesity)

キーワード:Nanopore

Single-molecule detection using nanopore have been developed in the past decade. The principle of detection among major nanopore sensors is detecting characteristic change of ionic current when a molecule passes through. DNA sequencing is one of the promising applications for nanopore sensing device. The sensitivity of DNA nanopore sequencer is rely on the diameter and thickness of the nanopore. To make precose size of nanopore on two dimensional crystals, ion milling by Helium ion microscope was applied with controlling the dose amount and focus distance.