3:30 PM - 3:45 PM
[8p-C18-7] Error Recovery Effect and High Reliable Method for Endurance in TaOx ReRAM
Keywords:ReRAM, semiconductor
Oral presentation
13 Semiconductors » 13.5 Semiconductor devices and related technologies
Fri. Sep 8, 2017 1:45 PM - 4:00 PM C18 (C18)
Yasuo Takahashi(Hokkaido Univ.)
3:30 PM - 3:45 PM
Keywords:ReRAM, semiconductor