Takato Asada

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Speaker, Author, Co-Author

Tue. Mar 14, 2017 9:30 AM - 11:45 AM 315 (315)

Oral presentation
| 13 Semiconductors
| 13.8 Compound and power electron devices and process technology

[14a-315-1~8] 13.8 Compound and power electron devices and process technology

10:00 AM - 10:15 AM

[14a-315-3] Excess carrier lifetime measurements for GaN epilayers on GaN substrates

〇(B)Takato Asada¹, Yoshihito Ichikawa¹, Kenji Ito², Kazuyoshi Tomita², Tetsuo Narita², Tetsu Kachi³, Masashi Kato¹ (1.Nagoya Inst. of Tech., 2.Toyota Central R&D Labs., 3.Nagoya Univ.)

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