Yuuki Uchida

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Speaker, Author, Co-Author

Wed. Mar 15, 2017 9:00 AM - 12:15 PM F201 (F201)

Oral presentation
| 15 Crystal Engineering
| 15.7 Crystal evaluation, impurities and crystal defects

[15a-F201-1~12] 15.7 Crystal evaluation, impurities and crystal defects

12:00 PM - 12:15 PM

△ [15a-F201-12] Evaluation of GaN wafer for power devices by Kelvin probe Force Microscopy(1)

〇Yuuki Uchida¹, Mitsuhiro Yasuno¹, Tatuki Suzuki¹, Mizuki Uchimori¹, Hidekazu Yamamoto¹ (1.CIT)