Shinichi Mae

→ Search for Shinichi Mae in Google Scholar

Speaker, Author, Co-Author

Wed. Mar 15, 2017 9:00 AM - 12:15 PM F204 (F204)

Oral presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[15a-F204-1~12] 15.6 Group IV Compound Semiconductors (SiC)

11:45 AM - 12:00 PM

△ [15a-F204-11] Microscopic FCA measurement for depth-resolved carrier lifetime measurements in SiC

〇(M1)Shinichi Mae¹, Takeshi Tawara^2,3, Hidekazu Tsuchida⁴, Masashi Kato¹ (1.NITech, 2.AIST, 3.Fuji Electcic Co., Ltd., 4.CRIEPI)