Takahiro Gotow

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Speaker, Author, Co-Author

Thu. Mar 16, 2017 1:15 PM - 6:30 PM 412 (412)

Oral presentation
| 13 Semiconductors
| 13.5 Semiconductor devices and related technologies

[16p-412-1~20] 13.5 Semiconductor devices and related technologies

6.1と13.3と13.5のコードシェアセッションあり

2:30 PM - 2:45 PM

△ [16p-412-6] Effects of source impurity concentration on electrical characteristics of GaAsSb/InGaAs TFET

〇(D)Takahiro Gotow¹, Manabu Mitsuhara², Takuya Hoshi², Hiroki Sugiyama², Mitsuru Takenaka¹, Shinichi Takagi¹ (1.Univ. Tokyo, 2.NTT)