Norimichi Chinone

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Speaker, Author, Co-Author

Fri. Mar 17, 2017 9:00 AM - 12:15 PM 301 (301)

Oral presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[17a-301-1~12] 15.6 Group IV Compound Semiconductors (SiC)

9:30 AM - 9:45 AM

△ [17a-301-3] Observation of time constant dependence of interface trap distributions using local-DLTS based on scanning nonlinear dielectric microscopy

〇Norimichi Chinone¹, Ryoji Kosugi², Yasunori Tanaka², Shinsuke Harada², Hajime Okumura², Yasuo Cho¹ (1.Tohoku Univ., 2.AIST)