Eigo Fujita

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Speaker, Author, Co-Author

Fri. Mar 17, 2017 1:45 PM - 5:00 PM 301 (301)

Oral presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[17p-301-1~11] 15.6 Group IV Compound Semiconductors (SiC)

4:00 PM - 4:15 PM

[17p-301-8] Reduction of surface roughness in Ba-enhanced oxidized SiO₂/SiC structures by reducing the amount of Ba and oxidation temperature

〇Eigo Fujita¹, Masato Tanaka¹, Atthawut Chanthaphan¹, Takuji Hosoi¹, Takayoshi Simura¹, Heiji Watanabe¹ (1.Osaka Univ.)