Symposium (Oral)

[16a-512-1~8] Imaging of interfaces in thin films and multilayers

Thu. Mar 16, 2017 9:00 AM - 12:15 PM 512 (512)

Atsushi Kohno(Fukuoka Univ), Masamitsu Takahasi(QST)

△：Presentation by Applicant for JSAP Young Scientists Presentation Award
▲：English Presentation
▼：Both of Above
No Mark：None of Above

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9:00 AM - 9:15 AM

[16a-512-1] Novel techniques to visualize buried interfaces in multilayered thin films

〇Kenji Sakurai¹ (1.NIMS)

9:15 AM - 9:45 AM

[16a-512-2] Multi-slice X-ray Ptychography: Towards Nano-imaging of Buried Interfaces

〇Yukio Takahashi^1,2 (1.Grad. Sch. of Eng. Osaka Univ., 2.RIKEN SPring-8 Center)

9:45 AM - 10:15 AM

[16a-512-3] X-ray fluorescence holography of thin films

〇Tomoteru Fukumura^1,2, Kouichi Hayashi³ (1.WPI-AIMR, Tohoku U, 2.Dept. Chem. Tohoku U, 3.Nagoya Inst. Tech.)

10:15 AM - 10:30 AM

[16a-512-4] Development of time-resolved x-ray magnetic circular dichroism systems for observing laser-induced magnetization reversal

〇Hiroki Wadati^1,2, Kohei Yamamoto^1,2, Kou Takubo¹, Yasuyuki Hirata^1,2, Yuichi Yokoyama^1,2, Susumu Yamamoto^1,2, Takuo Ohkochi³, Toyohiko Kinoshita³, Takeshi Seki⁴, Koki Takanashi⁴, Shik Shin¹, Iwao Matsuda^1,2 (1.ISSP, Univ. of Tokyo, 2.Dept. of Phys, Univ. of Tokyo, 3.JASRI, 4.IMR, Tohoku Univ)

10:30 AM - 10:45 AM

[16a-512-5] Magneto-optical effect using polarization modulated soft X-ray source

〇Yuya Kubota^1,2, Yasuyuki Hirata^1,2, Munetaka Taguchi³, Jun Miyawaki¹, Susumu Yamamoto^1,2, Rei Hobara², Shingo Yamamoto^1,2, Kohei Yamamoto^1,2, Takashi Someya^1,2, Kou Takubo¹, Yuichi Yokoyama^1,2, Mihoko Araki¹, Masami Fujisawa¹, Yoshihisa Harada¹, Masakiyo Tsunoda⁴, Hiroki Wadati^1,2, Shik Shin¹, Iwao Matsuda^1,2 (1.ISSP, 2.the Univ. of Tokyo, 3.NAIST, 4.Tohoku Univ.)

11:00 AM - 11:30 AM

▲ [16a-512-6] Visualization of buried interfaces by X-ray reflectivity imaging

〇Jinxing Jiang^1,2, Kenji Sakurai^2,1 (1.Univ. of Tsukuba, 2.Nat. Inst. for Mat. Sci.)

11:30 AM - 12:00 PM

[16a-512-7] A New Tool for X-ray Surface and Interface Structure Analysis using an X-ray Phase-Contrast Imaging Technique

〇Wataru Yashiro^1,2 (1.IMRAM, Tohoku Univ., 2.JST-ERATO)

12:00 PM - 12:15 PM

[16a-512-8] [JSAP Young Scientist Award Speech] Structural Analysis of Micro-Phase Separated Monolayers using X-ray Reflectometry

〇Masumi Eda¹, Eri Nasuno¹, Norihiro Kato¹, Ken-ichi Iimura¹ (1.Utsunomiya Univ.)

Symposium (Oral)

[16p-512-1~10] Imaging of interfaces in thin films and multilayers

Thu. Mar 16, 2017 1:45 PM - 5:00 PM 512 (512)

Yoshikazu Takeda(Aichi Sci. & Tech. Fdn.), Masamitsu Takahasi(QST)

△：Presentation by Applicant for JSAP Young Scientists Presentation Award
▲：English Presentation
▼：Both of Above
No Mark：None of Above

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1:45 PM - 2:00 PM

[16p-512-1] Ultrahigh Resolution Laser-excited Photoemission Electron Microscopy for Imaging of Interfacial Nanostructures

〇(PC)Toshiyuki Taniuchi¹, Yoshihito Motoyui¹, Shik Shin¹ (1.ISSP, Univ. of Tokyo)

2:00 PM - 2:15 PM

[16p-512-2] Enhanced Element Detection at the Interface in Multilayered Ultra-thin Films by X-rays

〇(M1)Haruya Kobayashi^1,2, Kenji Sakurai^2,1 (1.Univ. of Tsukuba, 2.NIMS)

2:15 PM - 2:30 PM

[16p-512-3] Fixing Methods of Thin Plastic Films for X-ray Reflectivity Measurement of Thin Films Formed on Flexible Substrates

Kodai Tokunaga², Hiroyuki Uebayashi², Takayuki Tajiri¹, Makoto Sato², 〇Atsushi Kohno¹ (1.Fukuoka Univ., 2.Toray Industries Inc.)

2:30 PM - 2:45 PM

▼ [16p-512-4] Interface imaging of elements in atomic scale
- Application of projection-type X-ray fluorescence imaging -

〇(M2)Wenyang Zhao^1,2, Kenji Sakurai^2,1 (1.Tsukuba Univ., 2.NIMS)

2:45 PM - 3:00 PM

[16p-512-5] Manipulation of electronic states in two-dimensional ruthenium by using
dissimilar metallic substrates

〇Satoshi Toyoda¹, Morita Masafumi¹, Fukuda Katsutoshi¹, Horiba Koii², Kumigashira Hiroshi², Matsubara Eiichiro¹ (1.Kyoto Univ, 2.KEK-PF)

3:15 PM - 3:45 PM

[16p-512-6] Automated structure analysis of perovskite oxide interfaces

〇Yusuke Wakabayashi¹ (1.Osaka Univ.)

3:45 PM - 4:15 PM

[16p-512-7] Spatial resolved measurement for electrode catalyst layer of polymer electrolyte fuel cells by synchrotron radiation

〇Oki Sekizawa^1,2 (1.JASRI, 2.UEC)

4:15 PM - 4:30 PM

[16p-512-8] Observation of strain field in Al ion-implanted silicon carbide crystals by angle-resolved X-ray topography and local rocking curve imaging- X-ray penetration-depth dependence-

〇Yumiko Takahashi¹, Keiichi Hirano¹, Takayoshi Shimura², Shinji Nagamachi³ (1.KEK-PF, 2.Osaka Univ, 3.Nagamachi Science Laboratory Co., Ltd.)

4:30 PM - 4:45 PM

[16p-512-9] Status of the polarized neutron reflectometer “SHARAKU” at MLF, J-PARC in the spring of 2017

〇Noboru MIYATA¹, Kazuhiko Soyama², Hiroyuki Aoki², Kazuhiro Akutsu¹, Takayasu Hanashima¹, Satoshi Kasai¹, Jun-ichi Suzuki¹, Dai Yamazaki² (1.CROSS Tokai, 2.J-PARC Center, JAEA)

4:45 PM - 5:00 PM

[16p-512-10] Methodological assessment of XANAM for efficient operation

〇Shushi Suzuki¹, Shingo Mukai², Wang-Jae Chun³, Masaharu Nomura⁴, Kiyotaka Asakura² (1.Nagoya Univ., 2.Hokkaido Univ., 3.ICU, 4.KEK-PF)

Sessions

Symposium » Imaging of interfaces in thin films and multilayers

[16a-512-1~8] Imaging of interfaces in thin films and multilayers

[16a-512-1] Novel techniques to visualize buried interfaces in multilayered thin films

[16a-512-2] Multi-slice X-ray Ptychography: Towards Nano-imaging of Buried Interfaces

[16a-512-3] X-ray fluorescence holography of thin films

[16a-512-4] Development of time-resolved x-ray magnetic circular dichroism systems for observing laser-induced magnetization reversal

[16a-512-5] Magneto-optical effect using polarization modulated soft X-ray source

▲ [16a-512-6] Visualization of buried interfaces by X-ray reflectivity imaging

[16a-512-7] A New Tool for X-ray Surface and Interface Structure Analysis using an X-ray Phase-Contrast Imaging Technique

[16a-512-8] [JSAP Young Scientist Award Speech] Structural Analysis of Micro-Phase Separated Monolayers using X-ray Reflectometry

[16p-512-1~10] Imaging of interfaces in thin films and multilayers

[16p-512-1] Ultrahigh Resolution Laser-excited Photoemission Electron Microscopy for Imaging of Interfacial Nanostructures

[16p-512-2] Enhanced Element Detection at the Interface in Multilayered Ultra-thin Films by X-rays

[16p-512-3] Fixing Methods of Thin Plastic Films for X-ray Reflectivity Measurement of Thin Films Formed on Flexible Substrates

▼ [16p-512-4] Interface imaging of elements in atomic scale
- Application of projection-type X-ray fluorescence imaging -

[16p-512-5] Manipulation of electronic states in two-dimensional ruthenium by using
dissimilar metallic substrates

[16p-512-6] Automated structure analysis of perovskite oxide interfaces

[16p-512-7] Spatial resolved measurement for electrode catalyst layer of polymer electrolyte fuel cells by synchrotron radiation

[16p-512-8] Observation of strain field in Al ion-implanted silicon carbide crystals by angle-resolved X-ray topography and local rocking curve imaging- X-ray penetration-depth dependence-

[16p-512-9] Status of the polarized neutron reflectometer “SHARAKU” at MLF, J-PARC in the spring of 2017

[16p-512-10] Methodological assessment of XANAM for efficient operation

Authentication

Sessions

Symposium » Imaging of interfaces in thin films and multilayers

[16a-512-1~8] Imaging of interfaces in thin films and multilayers

▲ [16a-512-6] Visualization of buried interfaces by X-ray reflectivity imaging

[16p-512-1~10] Imaging of interfaces in thin films and multilayers

▼ [16p-512-4] Interface imaging of elements in atomic scale- Application of projection-type X-ray fluorescence imaging -

Authentication

▼ [16p-512-4] Interface imaging of elements in atomic scale
- Application of projection-type X-ray fluorescence imaging -