The 64th JSAP Spring Meeting, 2017

Presentation information

Oral presentation

15 Crystal Engineering » 15.7 Crystal evaluation, impurities and crystal defects

[14a-F201-1~11] 15.7 Crystal evaluation, impurities and crystal defects

Tue. Mar 14, 2017 9:15 AM - 12:15 PM F201 (F201)

Kazuhisa Torigoe(SUMCO), Hiroaki Kariyazaki(GWJ)

12:00 PM - 12:15 PM

[14a-F201-11] The mechanisms of self-diffusion in silicon crystals

Masashi Suezawa1, Yosiaki Iijima1, Ichiro Yonenaga1 (1.I.M.R., Tohoku Univ.)

Keywords:silicon, self diffusion, vacancy

Self-diffusion in Si crystals occurs with both the vacancy mechanism and interstitial mechanism. The contributions of those mechanisms to self-diffusion were not clarified since properties of vacancies and interstitials were not determined experimentally. Measurements of diffusion constant was also difficult since effects of impurities were very large. Recently, good data of diffusion constant were obtained with careful experiments. We analyzed that data with the use of our data on the properties of point defects and determined the contribution of vacancy mechanism and interstitial mechanism to the self-diffusion.