The 64th JSAP Spring Meeting, 2017

Presentation information

Oral presentation

13 Semiconductors » 13.8 Compound and power electron devices and process technology

[15a-315-1~10] 13.8 Compound and power electron devices and process technology

Wed. Mar 15, 2017 9:00 AM - 11:45 AM 315 (315)

Taketomo Sato(Hokkaido Univ.)

10:00 AM - 10:15 AM

[15a-315-5] Junction barrier Schottky diodes with a thin p<sup>+</sup>-GaN layer fabricated on free-standing GaN substrate

〇(M1)Kentarou Hayashi1, Hirofumi Tsuge1, Hiroshi Ohta1, Fumimasa Horikiri2, Yoshinobu Narita2, Takehiro Yoshida2, Tohru Nakamura1, Tomoyoshi Mishima1 (1.Hosei Univ., 2.SCIOCS)

Keywords:Gallium Nitride, Junction barrier Schottky diodes

Junction barrier Schottky (JBS) diodes were fabricated using simple epitaxial layer structures of p+GaN(10-20 nm, Mg=2e20 cm-3)/n-GaN/n-GaN substrate. This structure enables easy fabrication of JBS by shallow trench-formation processing. The JBS operation was confirmed by electroluminescence imaging.