The 64th JSAP Spring Meeting, 2017

Presentation information

Oral presentation

11 Superconductivity » 11.4 Analog applications and their related technologies

[16a-F205-1~11] 11.4 Analog applications and their related technologies

Thu. Mar 16, 2017 9:00 AM - 12:00 PM F205 (F205)

Yuji Miyato(Osaka Univ.), Masashi Ohno(University of Tokyo)

9:45 AM - 10:00 AM

[16a-F205-4] Critical current of transition edge sensors

Kaori Hattori1, Ryo Kobayashi2, Shuichiro Inoue2, Daiji Fukuda1 (1.AIST, 2.Nippon Univ.)

Keywords:transition edge sensor, critical current, single photon detector

Optical transition edge sensor (TES) detectors which can resolve an energy of a single photon have proven desirable in quantum information and biological imaging. To optimize the TESes, their physical models should be understood well. Behaviors of the critical current of the detectors will reveal which model our TESes follow. We report critical current measurements of our optical TESes.