3:00 PM - 3:15 PM
▼ [16p-413-5] Relationship between initial properties and reliability of Ge gate stacks
Keywords:Germanium, Oxide reliability
Oral presentation
13 Semiconductors » 13.3 Insulator technology
Thu. Mar 16, 2017 2:00 PM - 5:00 PM 413 (413)
Toshifumi Irisawa(AIST), Shinichi Takagi(Univ.Tokyo)
3:00 PM - 3:15 PM
Keywords:Germanium, Oxide reliability