Yuuki Uchida

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Speaker, Author, Co-Author

Wed. Sep 19, 2018 9:00 AM - 12:00 PM 131 (131+132)

Oral presentation
| 15 Crystal Engineering
| 15.7 Crystal characterization, impurities and crystal defects

[19a-131-1~11] 15.7 Crystal characterization, impurities and crystal defects

10:15 AM - 10:30 AM

[19a-131-6] Evaluation of SiC-Schottky barrier diode by multifunctional scanning probe microscope 2

〇Yuuki Uchida¹, Mizuki Nakajima¹, Nobuo Satoh¹, Hidekazu Yamamoto¹ (1.Chiba Inst. of Tech)

Thu. Sep 20, 2018 9:30 AM - 11:30 AM PA (Event Hall)

Poster presentation
| 15 Crystal Engineering
| 15.7 Crystal characterization, impurities and crystal defects

[20a-PA6-1~9] 15.7 Crystal characterization, impurities and crystal defects

9:30 AM - 11:30 AM

[20a-PA6-6] Evaluation of trench SiC-MOSFET by multifunctional scanning probe microscope

〇Yuuki Uchida¹, Atsushi Doi¹, Mizuki Nakajima¹, Nobuo Satoh¹, Hidekazu Yamamoto¹ (1.Chiba Inst. of Tech)