The 79th JSAP Autumn Meeting, 2018

Presentation information

Oral presentation

15 Crystal Engineering » 15.4 III-V-group nitride crystals

[19p-146-1~22] 15.4 III-V-group nitride crystals

Wed. Sep 19, 2018 1:15 PM - 7:15 PM 146 (Reception Hall)

Mark Holmes(The University of Tokyo), Jun Tatebayashi(Osaka Univ.), Tomoyuki Tanikawa(Tohoku Univ.)

5:30 PM - 5:45 PM

[19p-146-16] Size-dependent optical characterization of InGaN/GaN multi quantum well based nanopillars fabricated by Hydrogen Environment Anisotropic Thermal Etching (HEATE)

Yusuke Namae1, Daichi Ito1, Yusei Kawasaki1, Yuki Ohe1, Akihiro Matsuoka1, Yuta Moriya1, Akihiko Kikuchi1,2 (1.Sophia Univ., 2.Sophia Nanotechnology Research Center)

Keywords:nanostructure, Nitride, Gallium Nitride

InGaN / GaN quantum well based nanostructure is an attractive material that improves light emission characteristics by strain relaxation effect, threading dislocation-isolation effect, light extraction efficiency, and the like. We have studied hydrogen anisotropic thermal etching (HEATE) method which can perform low damage nanofabrication by thermal decomposition of GaN in hydrogen atmosphere and investigated etching characteristics of GaN and InGaN / GaN nanostructure LED production and so on. In this study, we report the InGaN disk diameter dependence of photoluminescence (PL) emission characteristics of InGaN / GaN nanopillar arrays fabricated at the range of InGaN disk diameter from 38 to 2020 nm by HEATE.