The 79th JSAP Autumn Meeting, 2018

Presentation information

Poster presentation

7 Beam Technology and Nanofabrication » 7 Beam Technology and Nanofabrication (7.1~7.5) (Poster)

[20a-PA1-1~11] 7 Beam Technology and Nanofabrication (Poster)

Thu. Sep 20, 2018 9:30 AM - 11:30 AM PA (Event Hall)

9:30 AM - 11:30 AM

[20a-PA1-7] Change in Extracted Ion Species due to Operation History of a Plasma-Sputter-Type Ion Source

Kentaro Yoshioka1, Takeshi Sakamoto1, Toshiro Kasuya1, Motoi Wada1 (1.Doshisha Univ.)

Keywords:sputtering, ion beam, reactive plasma

A planar magnetron sputter type ion source has been operated in both DC and RF sputtering modes to investigate the aluminum-nitride ion (AlN+) production. The test of ion beam extraction indicated that effects of source operation history contribued to the stable production of AlN+. Continuous beam extraction was conducted in the successive interval switching gases between Ar and N2. The results showed AlN+ beam current depending upon the AlN layer formed on source inner wall.