The 79th JSAP Autumn Meeting, 2018

Presentation information

Poster presentation

13 Semiconductors » 13.3 Insulator technology

[20a-PA5-1~14] 13.3 Insulator technology

Thu. Sep 20, 2018 9:30 AM - 11:30 AM PA (Event Hall)

9:30 AM - 11:30 AM

[20a-PA5-8] Electron retention characteristics of metal-oxide-nitride-oxide-silicon-type nonvolatile memory devices

〇(M2)Takuro Kishida1, Kiyoteru Kobayashi1 (1.Tokai Univ.)

Keywords:electron retention characteristics, silicon nitride