The 79th JSAP Autumn Meeting, 2018

Presentation information

Oral presentation

13 Semiconductors » 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[21a-135-1~10] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

Fri. Sep 21, 2018 9:00 AM - 11:45 AM 135 (135)

Nobuya Mori(Osaka Univ.)

9:15 AM - 9:30 AM

[21a-135-2] Low temperature deformation of single crystal Si by direct electric heating and the molecular dynamics simulation

〇(M1)Kai Tokuhiro1, Taiki Sakamoto1, Masahiro Shimizu1, Yasuhiko Shimotsuma1, Kiyotaka Miura1, Satoru Hachinohe2 (1.Kyoto Univ., 2.Proud Inc.)

Keywords:transfer process, molecular dynamics calculation, semiconductor

We have succeeded in plastically deforming single crystal CZ-Si at 850℃ lower than the melting point by 600℃ for 10 minutes with pressure and heat treatment by direct electric heating . In this study, uniaxial compression was performed without current in order to reproduce the deformation of single crystal Si by molecular dynamics calculation. In addition, we fabricated a mold with a fine pattern by FIB, and confirmed that the pattern can be transferred to the surface of the single crystal Si by direct electric heating.