The 79th JSAP Autumn Meeting, 2018

Presentation information

Oral presentation

13 Semiconductors » 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[21p-135-1~16] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

Fri. Sep 21, 2018 1:00 PM - 5:15 PM 135 (135)

Tomo Ueno(TUAT), Koichiro Saga(Sony)

3:30 PM - 3:45 PM

[21p-135-10] Fundamental Study on Graphene-Assisted Chemical Etching of Ge Surface
- Temperature Dependence of Etching Rate and Evaluation of Activation Energy -

Tomoki Hirano1, Yuki Nakata1, Hiroto Yamashita1, Shaoxian Li1, Kentaro Kawai1, Kazuya Yamamura1, Kenta Arima1 (1.Osaka Univ.)

Keywords:semiconductor surface, reduced graphene oxide, etching

We have investigated the fundamental properties of graphene-assisted chemical etching, which is preferential etching of Ge surfaces in contact with reduced graphene oxide (rGO) in water. In this study, in order to realize higher etching rate, we revealed the temperature dependence of the etching rate. Based on this temperature dependence, we analyzed the Arrhenius plot. It turns out that the activation energy of etching becomes lower on a Ge surface in contact with rGO sheets than on a Ge surface just placed in water.