TAKESHI KADONO

→ Search for TAKESHI KADONO in Google Scholar

Speaker, Author, Co-Author

Sun. Mar 18, 2018 1:15 PM - 7:30 PM D103 (56-103)

Oral presentation
| 15 Crystal Engineering
| 15.7 Crystal characterization, impurities and crystal defects

[18p-D103-1~23] 15.7 Crystal characterization, impurities and crystal defects

1:45 PM - 2:00 PM

[18p-D103-3] Characteristic of Molecular Ion Implanted Epitaxial Wafers (3)
- Annealing Behavior of Hydrogen Trapped Implantation related defects using RTA -

〇TAKESHI KADONO¹, Ryosuke Okuyama¹, Ryo Hirose¹, Ayumi Masada¹, Koji Kobayashi¹, Satoshi Shigematsu¹, Yoshihiro Koga¹, Hidehiko Okuda¹, Kazunari Kurita¹ (1.SUMCO)