Rikiichi Ohno

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Speaker, Author, Co-Author

Sun. Mar 18, 2018 1:00 PM - 3:45 PM B301 (53-301)

Oral presentation
| 13 Semiconductors
| 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

[18p-B301-1~10] 13.1 Fundamental properties, surface and interface, and simulations of Si related materials

2:45 PM - 3:00 PM

[18p-B301-7] Influence of VPT-Induced Trace Particles on Sensitivity in TXRF Measurements (2)

〇Rikiichi Ohno¹ (1.Sony Semiconductor Solutions)