Cuong Van Vuong

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Speaker, Author, Co-Author

Tue. Mar 20, 2018 9:00 AM - 12:00 PM D103 (56-103)

Oral presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[20a-D103-1~11] 15.6 Group IV Compound Semiconductors (SiC)

9:00 AM - 9:15 AM

[20a-D103-1] High-Temperature Reliability of Ni/Nb Ohmic Contacts on 4H-SiC For Harsh Environment Applications

〇(D)Cuong Van Vuong¹, Ishikawa Seiji^1,2, Sezaki Hiroshi^1,2, Maeda Tomonori^1,2, Koganezawa Tomoyuki³, Ohshima Takeshi³, Miyazaki Takamichi⁴, Kuroki Shin-Ichiro¹ (1.RNBS, 2.Phenitec Semicon., 3.JASRI, 4.Tohoku Univ.)

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