Kyoji Mizoguchi

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Speaker, Author, Co-Author

Sat. Mar 17, 2018 1:30 PM - 3:30 PM P8 (P)

Poster presentation
| 13 Semiconductors
| 13.5 Semiconductor devices and related technologies

[17p-P8-1~24] 13.5 Semiconductor devices and related technologies

1:30 PM - 3:30 PM

[17p-P8-20] RTN Impact on Data-Retention Failure/Recovery Mechanism in Sub-20nm NAND Flash Memories

〇Kyoji Mizoguchi¹, Tomonori Takahashi¹, Ken Takeuchi¹ (1.Chuo Univ.)

1:30 PM - 3:30 PM

[17p-P8-21] Data-Retention Lifetime evaluation of TLC NAND Flash Memories

〇Kyoji Mizoguchi¹, Tomonori Takahashi¹, Ken Takeuchi¹ (1.Chuo Univ.)

1:30 PM - 3:30 PM

[17p-P8-22] High Reliability Techniques of 3D-NAND Flash Memories by Lateral Charge Migration Suppression

〇Kyoji Mizoguchi¹, Shohei Kotaki¹, Yoshiaki Deguchi¹, Ken Takeuchi¹ (1.Chuo Univ.)