Daisuke Kobayashi

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Speaker, Author, Co-Author

Sun. Mar 18, 2018 1:15 PM - 6:00 PM G203 (63-203)

Oral presentation
| 13 Semiconductors
| 13.5 Semiconductor devices and related technologies

[18p-G203-1~18] 13.5 Semiconductor devices and related technologies

1:30 PM - 1:45 PM

[18p-G203-2] Soft Errors in Thin-BOX SOI SRAMs Exposed to Heavy Ion Radiation

〇Daisuke Kobayashi¹, Kazuyuki Hirose¹, Taichi Ito², Yuya Kakehashi², Osamu Kawasaki², Takahiro Makino³, Takeshi Ohshima³, Daisuke Matsuura⁴, Takanori Narita⁴, Masahiro Kato⁴, Shigeru Ishii⁴, Kazunori Masukawa⁴ (1.ISAS/JAXA, 2.R&D/JAXA, 3.QST, 4.MHI Ltd.)

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