Ryoji Hiraide

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Speaker, Author, Co-Author

Sun. Mar 18, 2018 4:00 PM - 6:00 PM P14 (P)

Poster presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[18p-P14-1~19] 15.6 Group IV Compound Semiconductors (SiC)

4:00 PM - 6:00 PM

[18p-P14-4] Investigation of Mechano-Chemical Treated Surface of 4H-SiC
by Scanning Probe Microscope

〇Ryoji Hiraide¹, Shinya Isoya¹, Toshihiro Okamoto², Masanobu Haraguchi² (1.Kemet Japan Co.,LTD., 2.FRC,Tokushima Univ.)