4:30 PM - 5:00 PM
[19p-C103-6] Local structural determination of N at SiO2/SiC interfaces by photoelectron diffraction
〇Daisuke Mori1,2, Fumihiko Matsui2 (1.Fuji Electric, 2.NAIST)
Mon. Mar 19, 2018 1:45 PM - 5:45 PM C103 (52-103)
4:30 PM - 5:00 PM
〇Daisuke Mori1,2, Fumihiko Matsui2 (1.Fuji Electric, 2.NAIST)