Hirokuni Asamizu

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Speaker, Author, Co-Author

Mon. Mar 19, 2018 1:30 PM - 6:00 PM D103 (56-103)

Oral presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[19p-D103-1~17] 15.6 Group IV Compound Semiconductors (SiC)

1:45 PM - 2:00 PM

[19p-D103-2] Analysis of stacking fault expansion in forward current degradation of 4H-SiC PiN diodes with transparent conductive oxide electrode

〇Hirokuni Asamizu^1,2, Junichi Nishino¹, Junji Senzaki¹, Kazutoshi Kojima¹, Tomohisa Kato¹, Hajime Okumura¹ (1.AIST, 2.Rohm Co.,Ltd.)