Symposium (Oral)
Symposium » Ion Beam and Surface Analysis: Recent Progress in Secondary Ion Mass Spectrometry (SIMS) and Its Application to Organic Analysis
Sun. Mar 18, 2018 1:45 PM - 5:30 PM C201 (52-201)
Ken Nakamura(AIST), Yasuhito Gotoh(Kyoto Univ.)
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1:45 PM - 2:15 PM
〇Jiro Matsuo1 (1.Kyoto Univ.)
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2:15 PM - 2:45 PM
〇Takuya Miyayama1 (1.ULVAC-PHI)
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2:45 PM - 3:15 PM
〇Satoshi Ninomiya1, Yuichiro Takagi1, Lee Chuin Chen1, Kenzo Hiraoka2 (1.Univ. Yamanashi, 2.Univ.Yamanashi CERC)
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3:15 PM - 3:45 PM
〇Yukio Fujiwara1, Naoki Saito1 (1.AIST)
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4:00 PM - 4:30 PM
〇Kousuke Moritani1 (1.Univ. of Hyogo)
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4:30 PM - 5:00 PM
〇Satoka Aoyagi1 (1.Seikei Univ.)
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5:00 PM - 5:30 PM
〇Akio Takano1 (1.Toyama Co., Ltd.)
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