Oral presentation

[18a-F210-1~13] 6.6 Probe Microscopy

6.6と12.2のコードシェアセッションあり

Sun. Mar 18, 2018 9:00 AM - 12:30 PM F210 (61-210)

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9:00 AM - 9:15 AM

[18a-F210-1] [The 2nd Thin Film and Surface Physics Division Award Speech] Dissolution Processes at Step Edges of Calcitein Water Investigated by High-Speed Frequency Modulation Atomic Force Microscopy andSimulation

〇Kazuki Miyata¹, John Tracey², Keisuke Miyazawa¹, Ville Haapasilta², Peter Spijker², Yuta Kawagoe¹, Adam S. Foster^1,2, Katsuo Tsukamoto³, Takeshi Fukuma^1,4 (1.Kanazawa Univ., 2.Aalto Univ., 3.Tohoku Univ., 4.ACT-C/JST)

9:15 AM - 9:30 AM

△ [18a-F210-2] Fine processing of acrylic resin film by irradiating localized He/O₂ atmospheric pressure plasma jet using a probe microscope with a nanopipette.

〇Sho Yamamoto¹, Daisuke Morimatsu¹, Atsushi Nakamura¹, Akihisa Ogino¹, Masaaki Nagatsu², Futoshi Iwata^1,2 (1.Graduate school of Integral Science and Technology, Shizuoka Univ., 2.Research Inst. of Electronics, Shizuoka Univ.)

9:30 AM - 9:45 AM

△ [18a-F210-3] Graphene-assisted Chemical Etching of Ge Surfaces in Water
~In situ AFM Observations of the Etching Process~

〇(M1)Shaoxian Li¹, Tomoki Hirano¹, Kentaro Kawai¹, Kazuya Yamamura¹, Kenta Arima¹ (1.Osaka Univ.)

9:45 AM - 10:00 AM

△ [18a-F210-4] Observation of an n^- layer of Si fast recovery diode by Kelvin probe force microscopy

〇(D)Takeshi Uruma¹, Nobuo Satoh², Hidekazu Yamamoto², Futoshi Iwata¹ (1.Graduate School of Sci. and Tech., Shizuoka Univ., 2.Chiba. Ins. of Tech.)

10:00 AM - 10:15 AM

△ [18a-F210-5] Quantitativity of KPFM Using Higher Order Resonance Frequency

〇(PC)Akinori Honda¹, Hiroshi Itoh¹ (1.AIST)

10:15 AM - 10:30 AM

△ [18a-F210-6] STS/UPS study on organic molecule 2D nanostructures on Cu(111)

〇Ryohei Nemoto¹, Eiichi Inami¹, Satoshi Kera², Peter Krueger¹, Toyokazu Yamada¹ (1.Chiba Univ, 2.IMS)

10:30 AM - 10:45 AM

△ [18a-F210-7] Atomic resolution imaging of the rutile-TiO₂(110) (1×2) reconstructed surface using non-contact atomic force microscopy

〇Shoki Ojima¹, Daiki Katsube¹, Yuji Miyato¹, Hayato Yamashita^1,2, Satoshi Abo¹, Masayuki Abe¹ (1.Osaka Univ., 2.JST PRESTO)

10:45 AM - 11:00 AM

△ [18a-F210-8] Investigation of charge state on O-rich rutile TiO₂(110) with KPFM

〇(M1)Yuuki Adachi¹, Quanzhen Zhang¹, Huanfei Wen¹, Yoshitaka Naitoh¹, Yanjun Li¹, Yasuhiro Sugawara¹ (1.Osaka Univ.)

11:00 AM - 11:15 AM

▼ [18a-F210-9] Measurement and manipulation of the charge state of adsorbed oxygen adatoms on rutile TiO₂(110)-1 × 1 surface by nc-AFM and KPFM

〇(D)Quanzhen Zhang¹, Huan Fei Wen¹, Yuuki Adachi¹, Yoshitaka Naitoh¹, Yan Jun Li¹, Yasuhiro Sugawara¹ (1.Osaka Univ.)

11:30 AM - 11:45 AM

[18a-F210-10] Investigation of carrier dynamics in organic thin-film transistors by time-resolved Kelvin-probe force microscopy without voltage modulation

〇Kouichi Innami¹, Kei Kobayashi¹, Hirofumi Yamada¹ (1.Dept. of Electronic Sci. & Eng., Kyoto Univ.)

11:45 AM - 12:00 PM

[18a-F210-11] Time-resolved electrostatic force microscope using cantilever oscillation

〇(M1)kentaro Kajimoto¹, Kento Araki¹, Yoichi Otsuka¹, Hiroshi Oyama¹, Takuya Matsumoto¹ (1.Osaka Univ.)

12:00 PM - 12:15 PM

[18a-F210-12] Development of Scanning Microwave Impedance Microscope Using Heterodyne Technique

〇Ryo Izumi¹, Yoshitaka Naitoh¹, Yan Jun Li¹, Yasuhiro Sugawara¹ (1.Osaka Univ.)

12:15 PM - 12:30 PM

[18a-F210-13] High speed FM-KPFM using Direct Sideband

〇(M1)Taisuke Ochi¹, Yoshitaka Naitoh¹, YanJun Li¹, Yasuhiro Sugawara¹ (1.Osaka Univ.)

Oral presentation

[19p-F210-1~16] 6.6 Probe Microscopy

Mon. Mar 19, 2018 1:15 PM - 5:30 PM F210 (61-210)

Yoichi Otsuka(Osaka Univ.), Akira Sasahara(Kobe Univ.)

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▲：英語発表
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1:15 PM - 1:30 PM

[19p-F210-1] Energy levels of atomic orbitals analyzed by atomic force microscopy

〇Yoshiaki Sugimoto¹, Jo Onoda¹, Ondracek Martin², Jelinek Pavel² (1.Univ. Tokyo, 2.ASCR)

1:30 PM - 1:45 PM

[19p-F210-2] High-resolution imaging of silicene on an Ag(111) surface by atomic force microscopy

〇(M1C)Keisuke Yabuoshi¹, Jo Onoda¹, Hiroki Miyazaki¹, Yoshiaki Sugimoto¹ (1.Univ. of Tokyo)

1:45 PM - 2:00 PM

[19p-F210-3] Progress in the development of elemental imaging method, XANAM (I)

〇Shushi Suzuki¹, Shingo Mukai², Wang-Jae Chun³, Masaharu Nomura⁴, Kiyotaka Asakura² (1.Nagoya Univ., 2.Hokkaido Univ., 3.ICU, 4.KEK-PF)

2:00 PM - 2:15 PM

[19p-F210-4] STM study of interaction between water and co-adsorbed molecules on Cu(110)

〇Akitoshi Shiotari¹, Hiroshi Okuyama², Shinichiro Hatta², Tetsuya Aruga², Ikutaro Hamada^3,4 (1.Univ. of Tokyo, 2.Kyoto Univ., 3.Osaka Univ., 4.NIMS)

2:15 PM - 2:30 PM

[19p-F210-5] STM superconductivity measurement on metal surface

〇Kumi Kobayashi¹, Toyokazu Yamada¹ (1.Chiba Univ.)

2:30 PM - 2:45 PM

[19p-F210-6] Theoretical examination on the development of paramagnetic resonance microscopy based on scanning nonlinear dielectric microscopy

〇Akihisa Harada¹, Yamagishi Yuji¹, Cho Yasuo¹ (1.Tohoku Univ RIEC)

2:45 PM - 3:00 PM

[19p-F210-7] Visualization of polystyrene nanoparticles buried in a polymer matrix by scanning thermal noise microscopy

〇Shunta Nosaka¹, Hiroshi Tono¹, Kuniko Kimura¹, Kei Kobayashi¹, Hirofumi Yamada¹ (1.Kyoto Univ.)

3:00 PM - 3:15 PM

[19p-F210-8] Research on dynamic behavior of the charged nano liquid in scanning probe electrospray ionization (SPESI)

〇Bui Kamihoriuchi¹, Yoichi Otsuka¹, Aya Takeuchi¹, Futoshi Iwata², Takuya Matsumoto¹ (1.Osaka Univ., 2.Shizuoka Univ.)

3:30 PM - 3:45 PM

[19p-F210-9] Force Sensitivity Improvement of FM-AFM in Liquid Metal

〇Makoto Murata¹, Nobumasa Tagai¹, Takashi Ichii¹, Toru Utsunomiya¹, Hiroyuki Sugimura¹ (1.Kyoto Univ.)

3:45 PM - 4:00 PM

[19p-F210-10] Development and Evaluation of Extended Tips for Cell Imaging

〇Taku Higasayama¹, Keisuke Miyazawa¹, Yuanshu Zhou¹, Yasufumi Takahashi^1,2,3, Takeshi Fukuma^1,3 (1.Kanazawa Univ., 2.JST PRESTO, 3.NanoLSI)

4:00 PM - 4:15 PM

[19p-F210-11] Rheological diagnosis of single cells by multi-frequency atomic force microscopy

〇(D)Ryosuke Tanaka¹, Kaori Shigetomi-Kuribayashi², Agus Subagyo¹, Kazuhisa Sueoka¹, Takaharu Okajima¹ (1.Info. Sci. & Tech. Hokkaido Univ., 2.Advance. Higher Edu. Hokkaido Univ.)

4:15 PM - 4:30 PM

[19p-F210-12] Investigation of specific interactions between streptavidin and biotin

〇Kazuna Sugimoto¹, Hiroaki Kominami¹, Kei Kobayashi¹, Hirofumi Yamada¹ (1.Dept. of Electronic Sci. & Eng., Kyoto Univ.)

4:30 PM - 4:45 PM

[19p-F210-13] Investigation of effect of electrolyte on interfacial water on calcium carbonate crystals

〇Yuki Araki¹, Kei Kobayashi¹, Hirofumi Yamada¹ (1.Kyoto Univ.)

4:45 PM - 5:00 PM

[19p-F210-14] Frequency Modulation AFM Analysis of Fe₂O₃(0001) Surfaces in Solvents

〇Akira Sasahara¹, Takuya Ogura¹, Ryohei Kokawa², Shiho Moriguchi³, Teppei Tsujimoto⁴, Hiroshi Onishi¹ (1.Kobe Univ., 2.Shimadzu Co., 3.Shimadzu Techno-Research Inc., 4.JXTG Nippon Oil & Energy Co.)

5:00 PM - 5:15 PM

[19p-F210-15] Molecular Scale Investigations of Hydration Structures of Long-Chain Alkanethiol Self-Assembled Monolayers by FM-AFM

〇Akito Fujita¹, Kei Kobayashi¹, Hirofumi Yamada¹ (1.Dept. of Electronic Sci. & Eng. Kyoto University)

5:15 PM - 5:30 PM

[19p-F210-16] Hydration structure measurements on mica and graphene using 3D-SFM

〇Keisuke Miyazawa¹, Chih-Wen Yang², Kazuki Miyata^1,3, Hwang Ing-Shouh², Takeshi Fukuma^1,3 (1.Kanazawa Univ., 2.Academica Sinica, 3.NanoLSI)

Poster presentation

[17p-P5-1~14] 6.6 Probe Microscopy

Sat. Mar 17, 2018 1:30 PM - 3:30 PM P5 (P)

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▲：英語発表
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1:30 PM - 3:30 PM

[17p-P5-1] Atomic resolution imaging of the anatase-TiO₂(001) (1×4) reconstructed surface by non-contact atomic force microscopy

〇(DC)daiki katsube¹, Ayhan Yurtsever¹, Masayuki Abe¹ (1.Osaka Univ.)

1:30 PM - 3:30 PM

[17p-P5-2] SPM imaging of DNA adsorbed on Graphene

〇Hiroyuki Tanaka¹, Masateru Taniguchi¹ (1.Osaka Univ)

1:30 PM - 3:30 PM

[17p-P5-3] Molecular-scale FM-AFM measurements of designed helical repeat proteins self-assembled on mica in liquid environments

〇Keisuke Miyazawa¹, Shuai Zhang², James J. De Yoreo², Takeshi Fukuma^1,3 (1.Kanazawa Univ., 2.PNNL, 3.NanoLSI)

1:30 PM - 3:30 PM

[17p-P5-4] Redox Activities on Semiconducting and Metallic Carbon Nanotubes Analyzed by Scanning Electrochemical Cell Microscopy

〇Akichika Kumatani^1,2, Miyu Shimura², Yasufumi Takahashi^3,4, Chiho Miura², Takeru Okada⁵, Hiroki Ida², Hitoshi Shiku², Seiji Samukawa⁵, Tomokazu Matsue² (1.Tohoku Univ. AIMR, 2.Tohoku Univ., 3.Kanazawa Univ., 4.JST-PRESTO, 5.Tohoku Univ. IFS)

1:30 PM - 3:30 PM

[17p-P5-5] Comparison of SSRM data of Lithium Ion battery electrodes

〇Yasushi Maeda¹, Taguchi Noboru¹, Sakaebe Hikari¹ (1.AIST)

1:30 PM - 3:30 PM

[17p-P5-6] In-situ Observation on Cathode Surface of Lead Acid Battery by means of Frequency Modulation Atomic Force Microscopy

〇Takuto Watanabe¹, Seiya Takahashi¹, Nobumitsu Hirai², Akinori Kogure³, Munehiro Kimura¹ (1.Nagaoka Univ. of Tech., 2.NIT. Suzuka College, 3.Shimadzu Techno-Research)

1:30 PM - 3:30 PM

[17p-P5-7] FM–AFM analysis of Si / ionic liquid interface during lithium ion insertion process

〇Kazuyuki Itakura¹, Yuya Takara¹, Takashi Ichii¹, Toru Utsunomiya¹, Hiroyuki Sugimura¹ (1.Kyoto Univ.)

1:30 PM - 3:30 PM

[17p-P5-8] Atom-resolved FM-AFM imaging with quartz force sensor in humidified air

〇(PC)Hiroaki Ooe¹, Toyoko Arai¹ (1.Kanazawa Univ.)

1:30 PM - 3:30 PM

[17p-P5-9] Development of multi-environment atomic force microscope for observation of ice surface structure (2)

〇Yuji Miyato¹, Katsuki Otani¹, Ken Nagashima², Masayuki Abe¹ (1.Osaka Univ., 2.Hokkaido Univ.)

1:30 PM - 3:30 PM

[17p-P5-10] Tungsten tip fabrication by flame etching

〇Toyokazu Yamada¹, Takayuki Yamaguchi¹, Eiichi Inami¹, Teruaki Ohno² (1.Chiba Univ., 2.Technex Lab)

1:30 PM - 3:30 PM

[17p-P5-11] Non-destructive local electrical conductivity measurement by using a multi-probe STM

〇Hiroyuki Mogi¹, Takafumi Bamba¹, Osamu Takeuchi¹, Hidemi Shigekawa¹ (1.Univ. of Tsukuba)

1:30 PM - 3:30 PM

[17p-P5-12] Nanoscale Light Emission Spectroscopy of Two-dimensionally Arrayed Ag Nanoparticles

〇Satoshi Katano¹, Masaki Hotsuki¹, Hideto Aichi¹, Yoichi Uehara¹ (1.RIEC, Tohoku Univ.)

1:30 PM - 3:30 PM

[17p-P5-13] Control of Ag atom's precipitation from a metal oxide nanodot

〇(B)Wataru Hiraya¹, Tsuyoshi Hasegawa¹ (1.Waseda Univ.)

1:30 PM - 3:30 PM

[17p-P5-14] Uniformity of Nanoparticles Deposited Using the Sandwitch Freeze Drying Method

〇Tomoo Sigehuzi¹ (1.AIST)

Sessions

6 Thin Films and Surfaces » 6.6 Probe Microscopy

[18a-F210-1~13] 6.6 Probe Microscopy

6.6と12.2のコードシェアセッションあり

△ [18a-F210-2] Fine processing of acrylic resin film by irradiating localized He/O2 atmospheric pressure plasma jet using a probe microscope with a nanopipette.

△ [18a-F210-3] Graphene-assisted Chemical Etching of Ge Surfaces in Water~In situ AFM Observations of the Etching Process~

△ [18a-F210-4] Observation of an n- layer of Si fast recovery diode by Kelvin probe force microscopy

△ [18a-F210-5] Quantitativity of KPFM Using Higher Order Resonance Frequency

△ [18a-F210-6] STS/UPS study on organic molecule 2D nanostructures on Cu(111)

△ [18a-F210-7] Atomic resolution imaging of the rutile-TiO2(110) (1×2) reconstructed surface using non-contact atomic force microscopy

△ [18a-F210-8] Investigation of charge state on O-rich rutile TiO2 (110) with KPFM

▼ [18a-F210-9] Measurement and manipulation of the charge state of adsorbed oxygen adatoms on rutile TiO2(110)-1 × 1 surface by nc-AFM and KPFM

[19p-F210-1~16] 6.6 Probe Microscopy

[17p-P5-1~14] 6.6 Probe Microscopy

Authentication

△ [18a-F210-2] Fine processing of acrylic resin film by irradiating localized He/O₂ atmospheric pressure plasma jet using a probe microscope with a nanopipette.

△ [18a-F210-3] Graphene-assisted Chemical Etching of Ge Surfaces in Water
~In situ AFM Observations of the Etching Process~

△ [18a-F210-4] Observation of an n^- layer of Si fast recovery diode by Kelvin probe force microscopy

△ [18a-F210-7] Atomic resolution imaging of the rutile-TiO₂(110) (1×2) reconstructed surface using non-contact atomic force microscopy

△ [18a-F210-8] Investigation of charge state on O-rich rutile TiO₂(110) with KPFM

▼ [18a-F210-9] Measurement and manipulation of the charge state of adsorbed oxygen adatoms on rutile TiO₂(110)-1 × 1 surface by nc-AFM and KPFM