Symposium (Oral)

[18p-C201-1~7] Ion Beam and Surface Analysis: Recent Progress in Secondary Ion Mass Spectrometry (SIMS) and Its Application to Organic Analysis

Sun. Mar 18, 2018 1:45 PM - 5:30 PM C201 (52-201)

Ken Nakamura(AIST), Yasuhito Gotoh(Kyoto Univ.)

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1:45 PM - 2:15 PM

[18p-C201-1] Innovative Technologies in Advanced SIMS:
From Novel Ion beam to Latest Mass Analysis Technique

〇Jiro Matsuo¹ (1.Kyoto Univ.)

2:15 PM - 2:45 PM

[18p-C201-2] TOF-SIMS analysis by means of low energy bismuth primary ion beam

〇Takuya Miyayama¹ (1.ULVAC-PHI)

2:45 PM - 3:15 PM

[18p-C201-3] Development of a vacuum-type electrospray droplet ion gun and its application to TOF-SIMS

〇Satoshi Ninomiya¹, Yuichiro Takagi¹, Lee Chuin Chen¹, Kenzo Hiraoka² (1.Univ. Yamanashi, 2.Univ.Yamanashi CERC)

3:15 PM - 3:45 PM

[18p-C201-4] Towards high lateral resolution and high sensitivity secondary ion mass spectrometry: cluster ion beam generation from a needle emitter wetted by protic ionic liquid

〇Yukio Fujiwara¹, Naoki Saito¹ (1.AIST)

4:00 PM - 4:30 PM

[18p-C201-5] Desorption/ionization process of organic molecules induced by molecular cluster ion beams

〇Kousuke Moritani¹ (1.Univ. of Hyogo)

4:30 PM - 5:00 PM

[18p-C201-6] Evaluation and data Analysis of biological samples and biomolecules by means of TOF-SIMS with cluster ion beam

〇Satoka Aoyagi¹ (1.Seikei Univ.)

5:00 PM - 5:30 PM

[18p-C201-7] The Trend of the International Standardization of Secondary Ion Mass Spectrometry

〇Akio Takano¹ (1.Toyama Co., Ltd.)

Sessions

Symposium » Ion Beam and Surface Analysis: Recent Progress in Secondary Ion Mass Spectrometry (SIMS) and Its Application to Organic Analysis

[18p-C201-1~7] Ion Beam and Surface Analysis: Recent Progress in Secondary Ion Mass Spectrometry (SIMS) and Its Application to Organic Analysis

[18p-C201-1] Innovative Technologies in Advanced SIMS:
From Novel Ion beam to Latest Mass Analysis Technique

[18p-C201-2] TOF-SIMS analysis by means of low energy bismuth primary ion beam

[18p-C201-3] Development of a vacuum-type electrospray droplet ion gun and its application to TOF-SIMS

[18p-C201-4] Towards high lateral resolution and high sensitivity secondary ion mass spectrometry: cluster ion beam generation from a needle emitter wetted by protic ionic liquid

[18p-C201-5] Desorption/ionization process of organic molecules induced by molecular cluster ion beams

[18p-C201-6] Evaluation and data Analysis of biological samples and biomolecules by means of TOF-SIMS with cluster ion beam

[18p-C201-7] The Trend of the International Standardization of Secondary Ion Mass Spectrometry

Authentication

Sessions

Symposium » Ion Beam and Surface Analysis: Recent Progress in Secondary Ion Mass Spectrometry (SIMS) and Its Application to Organic Analysis

[18p-C201-1~7] Ion Beam and Surface Analysis: Recent Progress in Secondary Ion Mass Spectrometry (SIMS) and Its Application to Organic Analysis

[18p-C201-1] Innovative Technologies in Advanced SIMS:From Novel Ion beam to Latest Mass Analysis Technique

[18p-C201-2] TOF-SIMS analysis by means of low energy bismuth primary ion beam

[18p-C201-3] Development of a vacuum-type electrospray droplet ion gun and its application to TOF-SIMS

[18p-C201-4] Towards high lateral resolution and high sensitivity secondary ion mass spectrometry: cluster ion beam generation from a needle emitter wetted by protic ionic liquid

[18p-C201-5] Desorption/ionization process of organic molecules induced by molecular cluster ion beams

[18p-C201-6] Evaluation and data Analysis of biological samples and biomolecules by means of TOF-SIMS with cluster ion beam

[18p-C201-7] The Trend of the International Standardization of Secondary Ion Mass Spectrometry

Authentication

[18p-C201-1] Innovative Technologies in Advanced SIMS:
From Novel Ion beam to Latest Mass Analysis Technique