Symposium (Oral)

[19p-C103-1~8] Advanced 3D atomic imaging to develop new materials and devices technologies

Mon. Mar 19, 2018 1:45 PM - 5:45 PM C103 (52-103)

Kazuo Tsutsui(Tokyo Tech), Tomoteru Fukumura(Tohoku Univ.)

△：奨励賞エントリー
▲：英語発表
▼：奨励賞エントリーかつ英語発表
空欄：どちらもなし

+Add all to schedule

1:45 PM - 2:15 PM

[19p-C103-1] Concept of 3D Active-site Science

〇Hiroshi Daimon¹ (1.Nara Institute of Science and Technology)

2:15 PM - 2:45 PM

[19p-C103-2] Atomic Resolution Holography Method using Synchrotron Radiation

〇Toyohiko Kinoshita¹ (1.JASRI)

2:45 PM - 3:15 PM

[19p-C103-3] Current Status of Local Structure Analyses Using Advanced Electron Microscopy

〇Koji Kimoto¹, Takuro Nagai¹, Jun Kikkawa¹, Shunsuke Yamashita¹ (1.NIMS)

3:15 PM - 3:45 PM

[19p-C103-4] Development and application of atomic-resolution electromagnetic field imaging STEM

〇Naoya Shibata^1,2 (1.Univ. of Tokyo, 2.JFCC NSRL)

4:00 PM - 4:30 PM

[19p-C103-5] Structural Analysis of In atoms in InGaN Layers with using X-ray Fluorescence Holography Technique

〇Tomoaki Kawamura¹, Koichi Hayashi² (1.Nichia Corp., 2.Nagoya Inst. Tech.)

4:30 PM - 5:00 PM

[19p-C103-6] Local structural determination of N at SiO₂/SiC interfaces by photoelectron diffraction

〇Daisuke Mori^1,2, Fumihiko Matsui² (1.Fuji Electric, 2.NAIST)

5:00 PM - 5:15 PM

▲ [19p-C103-7] Determining the Rh dopant site structure in Rh:SrTiO₃ photocatalysts

〇Mikk Lippmaa¹ (1.ISSP, Univ. Tokyo)

5:15 PM - 5:45 PM

[19p-C103-8] Active sites in the graphene growth process investigated by real-time observation

〇Koichiro Saiki¹ (1.Univ. Tokyo)

Sessions

Symposium » Advanced 3D atomic imaging to develop new materials and devices technologies

[19p-C103-1~8] Advanced 3D atomic imaging to develop new materials and devices technologies

[19p-C103-1] Concept of 3D Active-site Science

[19p-C103-2] Atomic Resolution Holography Method using Synchrotron Radiation

[19p-C103-3] Current Status of Local Structure Analyses Using Advanced Electron Microscopy

[19p-C103-4] Development and application of atomic-resolution electromagnetic field imaging STEM

[19p-C103-5] Structural Analysis of In atoms in InGaN Layers with using X-ray Fluorescence Holography Technique

[19p-C103-6] Local structural determination of N at SiO₂/SiC interfaces by photoelectron diffraction

▲ [19p-C103-7] Determining the Rh dopant site structure in Rh:SrTiO₃ photocatalysts

[19p-C103-8] Active sites in the graphene growth process investigated by real-time observation

Authentication

Sessions

Symposium » Advanced 3D atomic imaging to develop new materials and devices technologies

[19p-C103-1~8] Advanced 3D atomic imaging to develop new materials and devices technologies

[19p-C103-1] Concept of 3D Active-site Science

[19p-C103-2] Atomic Resolution Holography Method using Synchrotron Radiation

[19p-C103-3] Current Status of Local Structure Analyses Using Advanced Electron Microscopy

[19p-C103-4] Development and application of atomic-resolution electromagnetic field imaging STEM

[19p-C103-5] Structural Analysis of In atoms in InGaN Layers with using X-ray Fluorescence Holography Technique

[19p-C103-6] Local structural determination of N at SiO2/SiC interfaces by photoelectron diffraction

▲ [19p-C103-7] Determining the Rh dopant site structure in Rh:SrTiO3 photocatalysts

[19p-C103-8] Active sites in the graphene growth process investigated by real-time observation

Authentication

[19p-C103-6] Local structural determination of N at SiO₂/SiC interfaces by photoelectron diffraction

▲ [19p-C103-7] Determining the Rh dopant site structure in Rh:SrTiO₃ photocatalysts