[18a-P3-1~14] 7 Beam Technology and Nanofabrication（Poster）

[18a-P3-10] X-ray and neutron reflectivity imaging based on image reconstruction (2)

〇Kenji Sakurai¹, Jinxing Jiang¹ (1.NIMS)

Keywords:visualization, buried interface, reflectivity

Exotic functions of thin films are quite often connected to the unique atomic and molecular features of buried layers and interfaces. In reality, they are far from uniform, but seeing such inhomogeneity is extremely difficult. The present talk describes how we have solved the difficulties. The novel technique developed is the X-ray and neutron reflectivity imaging. This talk focuses on micro reflectivity imaging of neutrons. .