The 65h JSAP Spring Meeting, 2018

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Symposium (Oral)

Symposium » Semiconductor Device Simulation: Applications and Future Perspectives

[18p-A202-1~15] Semiconductor Device Simulation: Applications and Future Perspectives

Sun. Mar 18, 2018 1:15 PM - 6:40 PM A202 (54-202)

Nobuya Mori(Osaka Univ.), Koichi Fukuda(AIST), Akira Hiroki(Kyoto Inst. of Tech.), Kenichiro Sonoda(Renesas), Nobutoshi Aoki(Toshiba Memory)

5:15 PM - 5:30 PM

[18p-A202-10] Analysis of Super-Steep SS PN-Body-Tied SOI FET by TCAD Simulation

〇Takayuki Mori1, Jiro Ida1 (1.Kanazawa Inst. of Tech.)

Keywords:SOI, steep subthreshold slope, TCAD