The 65h JSAP Spring Meeting, 2018

Presentation information

Symposium (Oral)

Symposium » Ion Beam and Surface Analysis: Recent Progress in Secondary Ion Mass Spectrometry (SIMS) and Its Application to Organic Analysis

[18p-C201-1~7] Ion Beam and Surface Analysis: Recent Progress in Secondary Ion Mass Spectrometry (SIMS) and Its Application to Organic Analysis

Sun. Mar 18, 2018 1:45 PM - 5:30 PM C201 (52-201)

Ken Nakamura(AIST), Yasuhito Gotoh(Kyoto Univ.)

4:30 PM - 5:00 PM

[18p-C201-6] Evaluation and data Analysis of biological samples and biomolecules by means of TOF-SIMS with cluster ion beam

Satoka Aoyagi1 (1.Seikei Univ.)

Keywords:SIMS, cluster ion, tissue