The 65h JSAP Spring Meeting, 2018

Presentation information

Oral presentation

13 Semiconductors » 13.7 Compound and power electron devices and process technology

[18p-C302-1~19] 13.7 Compound and power electron devices and process technology

Sun. Mar 18, 2018 1:45 PM - 7:00 PM C302 (52-302)

Naoteru Shigekawa(Osaka City Univ.), Taketomo Sato(Hokkaido Univ.)

6:30 PM - 6:45 PM

[18p-C302-18] Simulation of Heat Extraction from Ga2O3 MOSFETs with an Integrated SiC Heat Sink

ManHoi Wong1, Yoji Morikawa2, Masataka Higashiwaki1 (1.NICT, 2.Silvaco Japan)

Keywords:Ga2O3, MOSFET, heat

Wide-bandgap β-Ga2O3 has attracted considerable interest for power electronics, but its low thermal conductivity of less than 30 W/m·K limits the performance and reliability of Ga2O3 devices. A common approach to address self-heating in high power transistors involves integrating active device layers with a thermally conductive foreign substrate for heat extraction. As a proof of concept, we performed electrothermal simulations in this work to demonstrate the effectiveness of polycrystalline SiC as a heat sink material for reducing the channel temperature and improving the DC characteristics of Ga2O3 power devices.