[18p-F206-1~15] 6.2 Carbon-based thin films

[18p-F206-6] Energy band alignment of Al₂O₃/NO/H-diamond heterointerface determined by synchrotron x-ray photoelectron spectroscopy

Niloy Chandra Saha¹, Kazutoshi Takahashi², Masaki Imamura², 〇Makoto Kasu¹ (1.Saga Univ., 2.Synchrotron Center, Saga Univ.)

Keywords:Synchotron XPS, diamond, band alignment

In this study, energy band alignment of Al₂O₃ layer deposited NO-exposed H-diamond is determined using x-ray photoelectron spectroscopy (XPS).