The 65h JSAP Spring Meeting, 2018

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13 Semiconductors » 13.5 Semiconductor devices and related technologies

[18p-G203-1~18] 13.5 Semiconductor devices and related technologies

Sun. Mar 18, 2018 1:15 PM - 6:00 PM G203 (63-203)

Masumi Saitoh(TOSHIBA), Kousuke Miyaji(Shinshu Univ.)

5:00 PM - 5:15 PM

[18p-G203-15] Burst Error Reduction for Improvement of LDPC Correction Capability in TLC NAND Flash Memories

〇Toshiki Nakamura1, Yoshiaki Deguchi1, Ken Takeuchi1 (1.Chuo Univ.)

Keywords:NAND flash memory, Low-density parity-check code, Reliability