The 65h JSAP Spring Meeting, 2018

Presentation information

Oral presentation

8 Plasma Electronics » 8.2 Plasma deposition of thin film, plasma etching and surface treatment

[19p-C204-1~17] 8.2 Plasma deposition of thin film, plasma etching and surface treatment

Mon. Mar 19, 2018 1:45 PM - 6:15 PM C204 (52-204)

Hisataka Hayashi(TOSHIBA), Yoshihide Kihara(Tokyo Electron Miyagi Limited)

4:30 PM - 4:45 PM

[19p-C204-11] Temporal variation of Ar metastable density in pulse modulated inductively coupled plasma and its impact on the VUV/UV radiation-induced damage

Naoki Takeda1, Yasufumi Miyoshi2, Kenji Ishikawa1, Takayoshi Tsutsumi1, Keigo Takeda3, Takayuki Ohta3, Hiroki Kondo1, Masanaga Fukasawa2, Tetsuya Tatsumi2, Masaru Hori1 (1.Nagoya Univ., 2.Sony Semiconductor Solutions Corp., 3.Meijo Univ.)

Keywords:Ar metastable, pulse modulated plasma

プラズマエッチングプラズマにおける準安定 Ar 励起種(メタステーブル Ar 4s2)の密度を計測し,パルス変調プラズマにおけるプラズマ光発生に与える影響について考察した。