The 65h JSAP Spring Meeting, 2018

Presentation information

Oral presentation

15 Crystal Engineering » 15.6 Group IV Compound Semiconductors (SiC)

[19p-D103-1~17] 15.6 Group IV Compound Semiconductors (SiC)

Mon. Mar 19, 2018 1:30 PM - 6:00 PM D103 (56-103)

Toshiyuki Isshiki(Kyoto Inst. Tech.), Johji Nishio(Toshiba)

2:30 PM - 2:45 PM

[19p-D103-5] SiC Epitaxial Reactor Repetitive Cleaning Using ClF3 Gas and Pyrolytic Carbon-Coated Susceptor

Keisuke Kurashima1, Hitoshi Habuka1, Hideki Ito2, Shinichi Mitani2, Yoshinao Takahashi3 (1.Yokohama Nat. Univ., 2.NuFlare Technologies, 3.Kanto Denka Kogyo)

Keywords:silicon carbide, chlorine trifluoride, cleaning

SiC CVD reactor cleaning was done by using ClF3 gas and pyrolytic carbon-coated susceptor. SiC film was made on the same susceptor again and partially removed. The detail of this cleaning will be discussed.