The 65h JSAP Spring Meeting, 2018

Presentation information

Symposium (Oral)

Symposium » Is Ge substituting for Si?

[19p-G203-1~7] Is Ge substituting for Si?

Mon. Mar 19, 2018 1:30 PM - 5:10 PM G203 (63-203)

Toshifumi Irisawa(AIST), Tsutomu Tezuka(TOSHIBA), Kazuhiko Endo(AIST)

2:00 PM - 2:30 PM

[19p-G203-2] Ge NW FETs Fabrication

Yao-Jen Lee Lee1, F.-J. Hou1, P.-J. Sung1, M.-S. Yeh1 (1.NDL)

Keywords:Ge, GAA, high k

Germanium is attractive for the future technology node application because of its two times higher electron mobility and 4 times higher hole mobility than that of Si counterpart. The lower band gap of Ge also allows the supply voltage scalability to satisfy the post-Si CMOS era. However, the Ge MOSFET technology is facing several serious challenges, including fast n-type dopant diffusion, high junction leakage, EOT scaling, Dit reduction and enormous dislocation defects in the Ge epi-layer on Si substrates because of the large lattice mismatch to Si. Herein, we propose a feasible pathway to scale the Ge MOSFET technology by using a Ge gate-all-around (GAA) nanowire (NW) FETs.