The 65h JSAP Spring Meeting, 2018

Presentation information

Oral presentation

16 Amorphous and Microcrystalline Materials » 16.1 Fundamental properties, evaluation, process and devices in disordered materials

[20a-G203-1~11] 16.1 Fundamental properties, evaluation, process and devices in disordered materials

Tue. Mar 20, 2018 9:00 AM - 11:45 AM G203 (63-203)

Tsuyoshi Honma(Nagaoka Univ. of Tech.), Tamihiro Gotoh(Gunma Univ.)

9:45 AM - 10:00 AM

[20a-G203-4] Frequency multiplier based on a Ge-Sb-Te thin film

Ryoka Kondo1, Naoki Shikakura1, Tatsuya Kanehira1, Shigeo Kawasaki2, Hitoshi Hayashi1, Toshihiro Nakaoka1 (1.Sophia Univ., 2.JAXA)

Keywords:Ge-Sb-Te, RFdevice

We have succeeded in fabrication of a frequency multiplier that requries no bias voltage, based on a Ge-Sb-Te thin film. The device shows a characteristic nonlinear I-V in the DC voltage range from -0.5V to 0.5V. In our RF measurement, the RF input was set to 100MHz and 0 dBm. The device outputted 12th harmonic (1.2GHz). The dependence of the output power of harmonics on the input power have demonstrated the output of the14th harmonic for 10 dBm input power, and higher output of the 3rd harmonic than the 2nd.