Tomoko Mizutani

→ Search for Tomoko Mizutani in Google Scholar

Speaker, Author, Co-Author

Wed. Sep 18, 2019 9:00 AM - 12:00 PM B11 (B11)

Oral presentation
| 13 Semiconductors
| 13.5 Semiconductor devices/ Interconnect/ Integration technologies

[18a-B11-1~11] 13.5 Semiconductor devices/ Interconnect/ Integration technologies

10:00 AM - 10:15 AM

[18a-B11-5] Statistical Analyses of Worst Case SRAM Data Retention Voltage by Extreme Value Theory

〇Tomoko Mizutani¹, Kiyoshi Takeuchi¹, Takuya Saraya¹, Masaharu Kobayashi^1,2, Toshiro Hiramoto¹ (1.IIS, Univ. of Tokyo, 2.VDEC, Univ. of Tokyo)