Michio Tajima

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Speaker, Author, Co-Author

Wed. Sep 18, 2019 1:30 PM - 3:00 PM C212 (C212)

Oral presentation
| 15 Crystal Engineering
| 15.7 Crystal characterization, impurities and crystal defects

[18p-C212-1~6] 15.7 Crystal characterization, impurities and crystal defects

1:30 PM - 1:45 PM

[18p-C212-1] Round-Robin Test of Photoluminescence Method after Electron Irradiation for Quantifying Low-Level Carbon in Silicon

〇Michio Tajima^1,2,3, Shuichi Samata^1,4, Satoko Nakagawa^1,5, Jun Oriyama¹, Noriyuki Ishihara^1,6 (1.JSNM, 2.ISAS/JAXA, 3.Meiji Univ., 4.SUMCO, 5.GWJ, 6.MIZUHO-IR)

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