Weichen Wen

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Speaker, Author, Co-Author

Thu. Sep 19, 2019 1:45 PM - 5:45 PM E305 (E305)

Oral presentation
| 13 Semiconductors
| 13.3 Insulator technology

[19p-E305-1~15] 13.3 Insulator technology

5:30 PM - 5:45 PM

▼ [19p-E305-15] Evaluation of Border Traps in Al₂O₃/GeO_x/p-Ge Stacks Using Deep-Level Transient Spectroscopy

〇(DC)Weichen Wen¹, Keisuke Yamamoto¹, Dong Wang¹, Hiroshi Nakashima² (1.IGSES, Kyushu Univ., 2.GIC, Kyushu Univ.)