Takanori Takahashi

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Speaker, Author, Co-Author

Fri. Sep 20, 2019 9:00 AM - 12:15 PM B31 (B31)

Oral presentation
| Joint Session K
| 21.1 Joint Session K "Wide bandgap oxide semiconductor materials and devices"

[20a-B31-1~12] 21.1 Joint Session K "Wide bandgap oxide semiconductor materials and devices"

10:45 AM - 11:00 AM

△ [20a-B31-7] Degradation phenomenon of reliability in high mobility oxide thin-film transistor

〇Takanori Takahashi¹, Mami N. Fujii¹, Miki Miyanaga², Juan Paolo Bermundo¹, Yasuaki Ishikawa¹, Yukiharu Uraoka¹ (1.NAIST, 2.Sumitomo Electric Industries, Ltd.)

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